Travelled to:
1 × France
1 × USA
Collaborated with:
N.Vijaykrishnan M.J.Irwin Y.Tsai
Talks about:
technolog (1) techniqu (1) consumpt (1) complet (1) reduct (1) leakag (1) implic (1) scale (1) power (1) phase (1)
Person: David Duarte
DBLP: Duarte:David
Contributed to:
Wrote 2 papers:
- DAC-2003-TsaiDVI #reduction #scalability
- Implications of technology scaling on leakage reduction techniques (YFT, DD, NV, MJI), pp. 187–190.
- DATE-2002-DuarteVI #power management
- A Complete Phase-Locked Loop Power Consumption Model (DD, NV, MJI), p. 1108.