Travelled to:1 × Germany
Collaborated with:P.Singh V.Narayanan
Talks about:processor (1) generat (1) hazard (1) driven (1) test (1) smt (1)
Person: David L. Landis
DBLP: Landis:David_L=
Contributed to:
2012Wrote 1 papers:
- DATE-2012-SinghNL #generative #smt #testing
- Hazard driven test generation for SMT processors (PS, VN, DLL), pp. 256–259.