Travelled to:
1 × USA
Collaborated with:
S.Mukhopadhyay
Talks about:
reliabl (1) design (1) consid (1) stack (1) model (1) event (1) devic (1) charg (1) dure (1) esd (1)
Person: Duckhwan Kim
DBLP: Kim:Duckhwan
Contributed to:
Wrote 1 papers:
- DAC-2014-KimM #3d #design #on the #reliability
- On the Design of Reliable 3D-ICs Considering Charged Device Model ESD Events During Die Stacking (DK, SM), p. 6.