Travelled to:
1 × USA
Collaborated with:
H.Konuk N.Mukherjee J.Rajski D.Solanki J.Tyszer J.Zawada
Talks about:
pattern (1) design (1) count (1) test (1) low (1)
Person: Elham K. Moghaddam
DBLP: Moghaddam:Elham_K=
Contributed to:
Wrote 1 papers:
- DAC-2015-KonukMMRSTZ #design
- Design for low test pattern counts (HK, EKM, NM, JR, DS, JT, JZ), p. 6.