Travelled to:5 × USA
Collaborated with:J.Rajski G.Mrugalski N.Mukherjee D.Czysz M.Kassab M.Gebala H.Konuk E.K.Moghaddam D.Solanki J.Zawada
Talks about:test (4) data (2) low (2) decompressor (1) architectur (1) compactor (1) selector (1) programm (1) function (1) compress (1)
Person: Jerzy Tyszer
DBLP: Tyszer:Jerzy
Contributed to:
20152014200720061995Wrote 5 papers:
- DAC-2015-KonukMMRSTZ #design
- Design for low test pattern counts (HK, EKM, NM, JR, DS, JT, JZ), p. 6.
- DAC-2014-GebalaMMRT #on the #using
- On Using Implied Values in EDT-based Test Compression (MG, GM, NM, JR, JT), p. 6.
- DAC-2007-MrugalskiRCT #power management #testing
- New Test Data Decompressor for Low Power Applications (GM, JR, DC, JT), pp. 539–544.
- DAC-2006-MrugalskiRT #programmable
- Test response compactor with programmable selector (GM, JR, JT), pp. 1089–1094.
- DAC-1995-KassabMRT #architecture #fault #functional #simulation
- Software Accelerated Functional Fault Simulation for Data-Path Architectures (MK, NM, JR, JT), pp. 333–338.