Collaborated with:
J.A.Abraham
Talks about:
transistor (1) generat (1) circuit (1) physic (1) failur (1) level (1) test (1) cmos (1)
Person: Hsi-Ching Shih
DBLP: Shih:Hsi=Ching
Contributed to:
Wrote 1 papers:
- DAC-1986-ShihA #generative #physics #testing
- Transistor-level test generation for physical failures in CMOS circuits (HCS, JAA), pp. 243–249.