Travelled to:
1 × Italy
1 × The Netherlands
Collaborated with:
C.Kästner T.Thüm C.Wong G.Saake M.Al-Hajjaji Lukas Lazarek M.Lochau A.Knüppel S.Mennicke I.Schaefer L.R.Soares S.Nadi E.S.d.Almeida F.Benduhn M.Hentschel A.v.Rhein S.Krieter R.Schröter T.Leich
Talks about:
configur (4) test (4) product (3) system (3) featur (3) line (3) interact (2) softwar (2) variat (2) execut (2)
Person: Jens Meinicke
DBLP: Meinicke:Jens
Contributed to:
Wrote 8 papers:
- SPLC-2014-Al-HajjajiTMLS #product line #similarity #testing
- Similarity-based prioritization in software product-line testing (MAH, TT, JM, ML, GS), pp. 197–206.
- SPLC-2014-ThumMBHRS #model checking #product line #proving #theorem proving
- Potential synergies of theorem proving and model checking for software product lines (TT, JM, FB, MH, AvR, GS), pp. 177–186.
- ASE-2016-MeinickeWKTS #complexity #configuration management #interactive #on the
- On essential configuration complexity: measuring interactions in highly-configurable systems (JM, CPW, CK, TT, GS), pp. 483–494.
- GPCE-2016-Al-HajjajiMKSTL #configuration management #testing
- Tool demo: testing configurable systems with FeatureIDE (MAH, JM, SK, RS, TT, TL, GS), pp. 173–177.
- ESEC-FSE-2017-KnuppelTMMS #feature model #modelling #product line #question #research
- Is there a mismatch between real-world feature models and product-line research? (AK, TT, SM, JM, IS), pp. 291–302.
- ESEC-FSE-2018-WongMK #automation #configuration management #execution #higher-order #mutation testing #program repair #testing
- Beyond testing configurable systems: applying variational execution to automatic program repair and higher order mutation testing (CPW, JM, CK), pp. 749–753.
- GPCE-2018-SoaresMNKA #empirical #feature model #interactive #specification
- Exploring feature interactions without specifications: a controlled experiment (LRS, JM, SN, CK, ESdA), pp. 40–52.
- OOPSLA-2018-WongMLK #bytecode #execution #performance #program transformation
- Faster variational execution with transparent bytecode transformation (CPW, JM, LL, CK), p. 30.