Travelled to:2 × USA
Collaborated with:∅ P.G.Raeth G.B.Lamont J.M.Borky
Talks about:function (1) circuit (1) simul (1) short (1) model (1) logic (1) fault (1) bridg (1) test (1) cmos (1)
Person: John M. Acken
DBLP: Acken:John_M=
Contributed to:
19831981Wrote 2 papers:
- DAC-1983-Acken #fault #testing
- Testing for bridging faults (shorts) in CMOS circuits (JMA), pp. 717–718.
- DAC-1981-RaethALB #functional #logic #modelling #simulation
- Functional modelling for logic simulation (PGR, JMA, GBL, JMB), pp. 791–795.