Travelled to:
1 × USA
Collaborated with:
G.Jerke J.Lienig
Talks about:
electromigr (1) decompact (1) reliabl (1) complex (1) signal (1) layout (1) failur (1) driven (1) design (1) avoid (1)
Person: Jürgen Scheible
DBLP: Scheible:J=uuml=rgen
Contributed to:
Wrote 1 papers:
- DAC-2004-JerkeLS #design #layout
- Reliability-driven layout decompaction for electromigration failure avoidance in complex mixed-signal IC designs (GJ, JL, JS), pp. 181–184.