Göran Jerke, Jens Lienig, Jürgen Scheible
Reliability-driven layout decompaction for electromigration failure avoidance in complex mixed-signal IC designs
DAC, 2004.
@inproceedings{DAC-2004-JerkeLS, author = "Göran Jerke and Jens Lienig and Jürgen Scheible", booktitle = "{Proceedings of the 41st Design Automation Conference}", doi = "10.1145/996566.996618", isbn = "1-58113-828-8", pages = "181--184", publisher = "{ACM}", title = "{Reliability-driven layout decompaction for electromigration failure avoidance in complex mixed-signal IC designs}", year = 2004, }