Göran Jerke, Jens Lienig, Jürgen Scheible
Reliability-driven layout decompaction for electromigration failure avoidance in complex mixed-signal IC designs
DAC, 2004.
@inproceedings{DAC-2004-JerkeLS,
author = "Göran Jerke and Jens Lienig and Jürgen Scheible",
booktitle = "{Proceedings of the 41st Design Automation Conference}",
doi = "10.1145/996566.996618",
isbn = "1-58113-828-8",
pages = "181--184",
publisher = "{ACM}",
title = "{Reliability-driven layout decompaction for electromigration failure avoidance in complex mixed-signal IC designs}",
year = 2004,
}











