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Travelled to:
2 × USA
Collaborated with:
R.V.Meter S.Y.H.Su
Talks about:
microprocessor (1) standard (1) approach (1) output (1) detect (1) compon (1) stuck (1) input (1) fault (1) digit (1)

Person: Mark G. Karpovsky

DBLP DBLP: Karpovsky:Mark_G=

Contributed to:

DAC 19841984
DAC 19801980

Wrote 2 papers:

DAC-1984-KarpovskyM #approach #testing
An approach to the testing of microprocessors (MGK, RVM), pp. 196–202.
DAC-1980-KarpovskyS #component #detection #fault #standard
Detecting bridging and stuck-at faults at input and output pins of standard digital components (MGK, SYHS), pp. 494–505.

Bibliography of Software Language Engineering in Generated Hypertext (BibSLEIGH) is created and maintained by Dr. Vadim Zaytsev.
Hosted as a part of SLEBOK on GitHub.