Travelled to:
1 × France
1 × Germany
Collaborated with:
S.Hamdioui
Talks about:
nanoelectron (1) scheme (1) resist (1) memori (1) hybrid (1) effici (1) defect (1) toler (1) fault (1) decod (1)
Person: Nor Zaidi Haron
DBLP: Haron:Nor_Zaidi
Contributed to:
Wrote 2 papers:
- DATE-2012-HaronH #fault
- DfT schemes for resistive open defects in RRAMs (NZH, SH), pp. 799–804.
- DATE-2011-HaronH #fault tolerance #hybrid #low cost
- Cost-efficient fault-tolerant decoder for hybrid nanoelectronic memories (NZH, SH), pp. 265–268.