Travelled to:
1 × France
1 × USA
Collaborated with:
S.Ghosh N.Rathi
Talks about:
voltag (2) sttram (2) robust (2) simultan (1) testabl (1) process (1) variat (1) impact (1) calibr (1) refer (1)
Person: Seyedhamidreza Motaman
DBLP: Motaman:Seyedhamidreza
Contributed to:
Wrote 2 papers:
- DATE-2015-MotamanGR #adaptation #robust
- Impact of process-variations in STTRAM and adaptive boosting for robustness (SM, SG, NR), pp. 1431–1436.
- DAC-2014-MotamanG #array #robust #self #testing
- Simultaneous Sizing, Reference Voltage and Clamp Voltage Biasing for Robustness, Self-Calibration and Testability of STTRAM Arrays (SM, SG), p. 2.