Travelled to:1 × USA
Collaborated with:S.Kiamehr M.B.Tahoori S.R.Nassif
Talks about:technolog (1) approach (1) circuit (1) analysi (1) radiat (1) induc (1) error (1) devic (1) sram (1) soft (1)
Person: Thomas H. Osiecki
DBLP: Osiecki:Thomas_H=
Contributed to:
2014Wrote 1 papers:
- DAC-2014-KiamehrOTN #analysis #approach #fault
- Radiation-Induced Soft Error Analysis of SRAMs in SOI FinFET Technology: A Device to Circuit Approach (SK, THO, MBT, SRN), p. 6.