Travelled to:
1 × USA
Collaborated with:
D.Lee D.Blaauw D.Sylvester
Talks about:
leakag (2) techniqu (1) analysi (1) consid (1) total (1) minim (1) oxid (1) gate (1)
Person: Wesley Kwong
DBLP: Kwong:Wesley
Contributed to:
Wrote 1 papers:
- DAC-2003-LeeKBS #analysis
- Analysis and minimization techniques for total leakage considering gate oxide leakage (DL, WK, DB, DS), pp. 175–180.