Travelled to:
2 × USA
Collaborated with:
I.H.Jiang C.Chiang G.Lin Y.Chan S.Sinha
Talks about:
hotspot (2) extract (2) detect (2) critic (2) use (2) topolog (1) process (1) classif (1) machin (1) featur (1)
Person: Yen-Ting Yu
DBLP: Yu:Yen=Ting
Contributed to:
Wrote 2 papers:
- DAC-2013-YuLJC #classification #detection #feature model #using
- Machine-learning-based hotspot detection using topological classification and critical feature extraction (YTY, GHL, IHRJ, CC), p. 6.
- DAC-2012-YuCSJC #design #detection #using
- Accurate process-hotspot detection using critical design rule extraction (YTY, YCC, SS, IHRJ, CC), pp. 1167–1172.