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Collaborated with:
Ying-Jen Chen Bo-Cheng Wang J.Wu C.Chien
Talks about:
semiconductor (1) manufactur (1) multivari (1) classif (1) detect (1) analyt (1) fault (1) data (1) big (1)

Person: Yi-Chia Wu

DBLP DBLP: Wu:Yi=Chia

Contributed to:

CASE 20172017

Wrote 1 papers:

CASE-2017-ChenWWWC #big data #classification #detection #fault #multi
Big data analytic for multivariate fault detection and classification in semiconductor manufacturing (YJC, BCW, JZW, YCW, CFC), pp. 731–736.
Bibliography of Software Language Engineering in Generated Hypertext (BibSLEIGH) is created and maintained by Dr. Vadim Zaytsev.
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