Edith Beigné, Alexandre Valentian, Bastien Giraud, Olivier Thomas, Thomas Benoist, Yvain Thonnart, Serge Bernard, G. Moritz, Olivier Billoint, Y. Maneglia, Philippe Flatresse, Jean-Philippe Noël, Fady Abouzeid, Bertrand Pelloux-Prayer, Anuj Grover, Sylvain Clerc, Philippe Roche, Julien Le Coz, Sylvain Engels, Robin Wilson
Ultra-wide voltage range designs in fully-depleted silicon-on-insulator FETs
DATE, 2013.
@inproceedings{DATE-2013-BeigneVGTBTBMBMFNAPGCRCEW,
acmid = "2485440",
author = "Edith Beigné and Alexandre Valentian and Bastien Giraud and Olivier Thomas and Thomas Benoist and Yvain Thonnart and Serge Bernard and G. Moritz and Olivier Billoint and Y. Maneglia and Philippe Flatresse and Jean-Philippe Noël and Fady Abouzeid and Bertrand Pelloux-Prayer and Anuj Grover and Sylvain Clerc and Philippe Roche and Julien Le Coz and Sylvain Engels and Robin Wilson",
booktitle = "{Proceedings of the 17th Conference on Design, Automation and Test in Europe}",
isbn = "978-1-4503-2153-2",
pages = "613--618",
publisher = "{EDA Consortium San Jose, CA, USA / ACM DL}",
title = "{Ultra-wide voltage range designs in fully-depleted silicon-on-insulator FETs}",
year = 2013,
}
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