Tapan J. Chakraborty, Vishwani D. Agrawal, Michael L. Bushnell
Delay Fault Models and Test Generation for Random Logic Sequential Circuits
DAC, 1992.
@inproceedings{DAC-1992-ChakrabortyAB,
acmid = "113938.117295",
author = "Tapan J. Chakraborty and Vishwani D. Agrawal and Michael L. Bushnell",
booktitle = "{Proceedings of the 29th Design Automation Conference}",
isbn = "0-8186-2822-7",
pages = "165--172",
publisher = "{IEEE Computer Society Press}",
title = "{Delay Fault Models and Test Generation for Random Logic Sequential Circuits}",
year = 1992,
}