Travelled to:3 × USA
Collaborated with:V.D.Agrawal M.L.Bushnell S.Bhawmik R.Bencivenga C.Lin
Talks about:sequenti (2) circuit (2) fault (2) delay (2) test (2) testabl (1) partial (1) generat (1) control (1) random (1)
Person: Tapan J. Chakraborty
DBLP: Chakraborty:Tapan_J=
Contributed to:
199319921991Wrote 3 papers:
- DAC-1993-ChakrabortyAB #design #fault #testing
- Design for Testability for Path Delay faults in Sequential Circuits (TJC, VDA, MLB), pp. 453–457.
- DAC-1992-ChakrabortyAB #fault #generative #logic #modelling #random #testing
- Delay Fault Models and Test Generation for Random Logic Sequential Circuits (TJC, VDA, MLB), pp. 165–172.
- DAC-1991-ChakrabortyBBL #testing #using
- Enhanced Controllability for IDDQ Test Sets Using Partial Scan (TJC, SB, RB, CJL), pp. 278–281.