Enhancing test efficiency for delay fault testing using multiple-clocked schemes
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Jing-Jia Liou, Li-C. Wang, Kwang-Ting Cheng, Jennifer Dworak, M. Ray Mercer, Rohit Kapur, Thomas W. Williams
Enhancing test efficiency for delay fault testing using multiple-clocked schemes
DAC, 2002.

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@inproceedings{DAC-2002-LiouWCDMKW,
	author        = "Jing-Jia Liou and Li-C. Wang and Kwang-Ting Cheng and Jennifer Dworak and M. Ray Mercer and Rohit Kapur and Thomas W. Williams",
	booktitle     = "{Proceedings of the 39th Design Automation Conference}",
	doi           = "10.1145/513918.514013",
	isbn          = "1-58113-461-4",
	pages         = "371--374",
	publisher     = "{ACM}",
	title         = "{Enhancing test efficiency for delay fault testing using multiple-clocked schemes}",
	year          = 2002,
}

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