Minsik Cho, Kun Yuan, Yongchan Ban, David Z. Pan
ELIAD: efficient lithography aware detailed router with compact post-OPC printability prediction
DAC, 2008.
@inproceedings{DAC-2008-ChoYBP,
author = "Minsik Cho and Kun Yuan and Yongchan Ban and David Z. Pan",
booktitle = "{Proceedings of the 45th Design Automation Conference}",
doi = "10.1145/1391469.1391598",
isbn = "978-1-60558-115-6",
pages = "504--509",
publisher = "{ACM}",
title = "{ELIAD: efficient lithography aware detailed router with compact post-OPC printability prediction}",
year = 2008,
}











