Minsik Cho, Kun Yuan, Yongchan Ban, David Z. Pan
ELIAD: efficient lithography aware detailed router with compact post-OPC printability prediction
DAC, 2008.
@inproceedings{DAC-2008-ChoYBP, author = "Minsik Cho and Kun Yuan and Yongchan Ban and David Z. Pan", booktitle = "{Proceedings of the 45th Design Automation Conference}", doi = "10.1145/1391469.1391598", isbn = "978-1-60558-115-6", pages = "504--509", publisher = "{ACM}", title = "{ELIAD: efficient lithography aware detailed router with compact post-OPC printability prediction}", year = 2008, }