BibSLEIGH — Gate Level Fault Diagnosis in Scan-Based BIST

Ismet Bayraktaroglu, Alex Orailoglu
Gate Level Fault Diagnosis in Scan-Based BIST
DATE, 2002.

DATE 2002

@inproceedings{DATE-2002-BayraktarogluO,
	acmid         = "874345",
	author        = "Ismet Bayraktaroglu and Alex Orailoglu",
	booktitle     = "{Proceedings of the Seventh Conference on Design, Automation and Test in Europe}",
	doi           = "10.1109/DATE.2002.998301",
	isbn          = "0-7695-1471-5",
	pages         = "376--381",
	publisher     = "{IEEE Computer Society}",
	title         = "{Gate Level Fault Diagnosis in Scan-Based BIST}",
	year          = 2002,
}

Ismet Bayraktaroglu, Alex OrailogluGate Level Fault Diagnosis in Scan-Based BISTDATE, 2002.

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Ismet Bayraktaroglu, Alex Orailoglu
Gate Level Fault Diagnosis in Scan-Based BIST
DATE, 2002.