Interactive presentation: Process tolerant beta-ratio modulation for ultra-dynamic voltage scaling
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Myeong-Eun Hwang, Tamer Cakici, Kaushik Roy
Interactive presentation: Process tolerant beta-ratio modulation for ultra-dynamic voltage scaling
DATE, 2007.

DATE 2007
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@inproceedings{DATE-2007-HwangCR,
	author        = "Myeong-Eun Hwang and Tamer Cakici and Kaushik Roy",
	booktitle     = "{Proceedings of the 11th Conference on Design, Automation and Test in Europe}",
	doi           = "10.1145/1266366.1266705",
	isbn          = "978-3-9810801-2-4",
	pages         = "1550--1555",
	publisher     = "{ACM}",
	title         = "{Interactive presentation: Process tolerant beta-ratio modulation for ultra-dynamic voltage scaling}",
	year          = 2007,
}

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