Georges G. E. Gielen, Elie Maricau
Stochastic degradation modeling and simulation for analog integrated circuits in nanometer CMOS
DATE, 2013.
@inproceedings{DATE-2013-GielenM,
acmid = "2485368",
author = "Georges G. E. Gielen and Elie Maricau",
booktitle = "{Proceedings of the 17th Conference on Design, Automation and Test in Europe}",
isbn = "978-1-4503-2153-2",
pages = "326--331",
publisher = "{EDA Consortium San Jose, CA, USA / ACM DL}",
title = "{Stochastic degradation modeling and simulation for analog integrated circuits in nanometer CMOS}",
year = 2013,
}