@inproceedings{DATE-2013-WangXZWYWNW,
	acmid         = "2485581",
	author        = "Xuan Wang and Jiang Xu and Wei Zhang and Xiaowen Wu and Yaoyao Ye and Zhehui Wang and Mahdi Nikdast and Zhe Wang",
	booktitle     = "{Proceedings of the 17th Conference on Design, Automation and Test in Europe}",
	isbn          = "978-1-4503-2153-2",
	pages         = "1221--1224",
	publisher     = "{EDA Consortium San Jose, CA, USA / ACM DL}",
	title         = "{Active power-gating-induced power/ground noise alleviation using parasitic capacitance of on-chip memories}",
	year          = 2013,
}