Xiaolin Zhang, Jing Ye, Yu Hu, Xiaowei Li
Capturing post-silicon variation by layout-aware path-delay testing
DATE, 2013.
@inproceedings{DATE-2013-ZhangYH0,
acmid = "2485359",
author = "Xiaolin Zhang and Jing Ye and Yu Hu and Xiaowei Li",
booktitle = "{Proceedings of the 17th Conference on Design, Automation and Test in Europe}",
isbn = "978-1-4503-2153-2",
pages = "288--291",
publisher = "{EDA Consortium San Jose, CA, USA / ACM DL}",
title = "{Capturing post-silicon variation by layout-aware path-delay testing}",
year = 2013,
}