Ji Li, Qing Xie, Yanzhi Wang, Shahin Nazarian, Massoud Pedram
Leakage power reduction for deeply-scaled FinFET circuits operating in multiple voltage regimes using fine-grained gate-length biasing technique
DATE, 2015.
@inproceedings{DATE-2015-LiXWNP,
acmid = "2757177",
author = "Ji Li and Qing Xie and Yanzhi Wang and Shahin Nazarian and Massoud Pedram",
booktitle = "{Proceedings of the 19th Conference and Exhibition on Design, Automation and Test in Europe}",
isbn = "978-3-9815370-4-8",
pages = "1579--1582",
publisher = "{ACM}",
title = "{Leakage power reduction for deeply-scaled FinFET circuits operating in multiple voltage regimes using fine-grained gate-length biasing technique}",
year = 2015,
}