Wen Ching Wu, Chung-Len Lee, Jwu E. Chen, Won Yih Lin
Distributed Fault Simulation for Sequential Circuits by Pattern Partitioning
DATE, 1994.
@inproceedings{EDAC-1994-WuLCL,
author = "Wen Ching Wu and Chung-Len Lee and Jwu E. Chen and Won Yih Lin",
booktitle = "{Proceedings of the European Conference on Design Automation (EDAC), European Test Conference (ETC) and the European Event in ASIC Design (EUROASIC)}",
isbn = "0-8186-5410-4",
pages = "661",
publisher = "{IEEE Computer Society}",
title = "{Distributed Fault Simulation for Sequential Circuits by Pattern Partitioning}",
year = 1994,
}