Travelled to:1 × France
1 × USA
Collaborated with:C.Lee J.E.Chen W.Y.Lin
Talks about:fault (2) probabilist (1) distribut (1) sequenti (1) testabl (1) pattern (1) circuit (1) partit (1) measur (1) simul (1)
Person: Wen Ching Wu
DBLP: Wu:Wen_Ching
Contributed to:
1994
1991Wrote 2 papers:
- EDAC-1994-WuLCL #clustering #distributed #fault #simulation
- Distributed Fault Simulation for Sequential Circuits by Pattern Partitioning (WCW, CLL, JEC, WYL), p. 661.
- DAC-1991-WuL #fault #probability #testing
- A Probabilistic Testability Measure for Delay Faults (WCW, CLL), pp. 440–445.