Travelled to:1 × Germany
1 × USA
5 × France
Collaborated with:C.K.Landrock K.Saab N.B.Hamida K.Arabi M.Jamoussi P.Gburzynski W.Olesinski A.Abderrahman Y.Savaria B.Omrane Y.Chuo J.Aristizabal
Talks about:test (3) testabl (2) effici (2) analog (2) digit (2) temperatur (1) capacitor (1) wireless (1) simultan (1) protocol (1)
Person: Bozena Kaminska
DBLP: Kaminska:Bozena
Contributed to:
201120102007
2000200019971994Wrote 8 papers:
- DATE-2011-LandrockOCKA #2d #3d #integration
- 2D and 3D integration with organic and silicon electronics (CKL, BO, YC, BK, JA), pp. 899–904.
- DATE-2010-LandrockK
- High temperature polymer capacitors for aerospace applications (CKL, BK), pp. 1349–1352.
- DATE-2007-GburzynskiKO #ad hoc #low cost #network #performance #protocol
- A tiny and efficient wireless ad-hoc protocol for low-cost sensor networks (PG, BK, WO), pp. 1557–1562.
- DAC-2000-SaabHK
- Closing the gap between analog and digital (KS, NBH, BK), pp. 774–779.
- DATE-2000-SaabHK #fault #generative #parametricity #simulation
- Parametric Fault Simulation and Test Vector Generation (KS, NBH, BK), pp. 650–656.
- EDTC-1997-ArabiK #performance #testing #using
- Efficient and accurate testing of analog-to-digital converters using oscillation-test method (KA, BK), pp. 348–352.
- EDAC-1994-AbderrahmanKS #estimation
- Estimation of Simultaneous Switching Power and Ground Noise of Static CMOS Combinational Circuits (AA, BK, YS), p. 658.
- EDAC-1994-JamoussiK #approach #evaluation #named #testing
- M-Testability: An Approach for Data-Path Testability Evaluation (MJ, BK), pp. 449–455.