Travelled to:1 × France
Collaborated with:S.Sarrazin S.Evain Y.Bonhomme V.Gherman
Talks about:overhead (1) perform (1) concurr (1) shadow (1) detect (1) design (1) fault (1) delay (1) scan (1) flop (1)
Person: Lirida Alves de Barros Naviner
DBLP: Naviner:Lirida_Alves_de_Barros
Contributed to:
2013Wrote 1 papers:
- DATE-2013-SarrazinENBG #concurrent #design #detection #fault #performance
- Scan design with shadow flip-flops for low performance overhead and concurrent delay fault detection (SS, SE, LAdBN, YB, VG), pp. 1077–1082.