Travelled to:4 × France
Collaborated with:S.Evain V.Gherman S.Sarrazin L.A.d.B.Naviner J.Massas S.Chevobbe M.Cartron N.Seymour P.Girard L.Guiller C.Landrault S.Pravossoudovitch A.Virazel
Talks about:concurr (2) design (2) error (2) scan (2) base (2) low (2) constrain (1) overhead (1) protect (1) predict (1)
Person: Yannick Bonhomme
DBLP: Bonhomme:Yannick
Contributed to:
2013201120092004Wrote 4 papers:
- DATE-2013-SarrazinENBG #concurrent #design #detection #fault #performance
- Scan design with shadow flip-flops for low performance overhead and concurrent delay fault detection (SS, SE, LAdBN, YB, VG), pp. 1077–1082.
- DATE-2011-GhermanMECB #concurrent #fault #predict #self
- Error prediction based on concurrent self-test and reduced slack time (VG, JM, SE, SC, YB), pp. 1626–1631.
- DATE-2009-GhermanECSB
- System-level hardware-based protection of memories against soft-errors (VG, SE, MC, NS, YB), pp. 1222–1225.
- DATE-v1-2004-BonhommeGGLPV #design #power management
- Design of Routing-Constrained Low Power Scan Chains (YB, PG, LG, CL, SP, AV), pp. 62–67.