Travelled to:
1 × France
Collaborated with:
S.Evain L.A.d.B.Naviner Y.Bonhomme V.Gherman
Talks about:
overhead (1) perform (1) concurr (1) shadow (1) detect (1) design (1) fault (1) delay (1) scan (1) flop (1)
Person: Sébastien Sarrazin
DBLP: Sarrazin:S=eacute=bastien
Contributed to:
Wrote 1 papers:
- DATE-2013-SarrazinENBG #concurrent #design #detection #fault #performance
- Scan design with shadow flip-flops for low performance overhead and concurrent delay fault detection (SS, SE, LAdBN, YB, VG), pp. 1077–1082.