Travelled to:
1 × France
Collaborated with:
S.Joshi A.Lombardot E.Beigné S.Girard
Talks about:
methodolog (1) statist (1) complex (1) circuit (1) leakag (1) effici (1) level (1) estim (1) gate (1)
Person: Marc Belleville
DBLP: Belleville:Marc
Contributed to:
Wrote 1 papers:
- DATE-2013-JoshiLBBG #estimation #performance #statistics
- A gate level methodology for efficient statistical leakage estimation in complex 32nm circuits (SJ, AL, MB, EB, SG), pp. 1056–1057.