Travelled to:
2 × France
2 × Germany
2 × USA
Collaborated with:
L.Carro A.A.Susin A.A.d.S.Jr. G.P.Jahn D.T.Franco
Talks about:
analog (4) test (3) cost (3) low (3) bist (2) methodolog (1) algorithm (1) loopback (1) circuit (1) signal (1)
Person: Marcelo Negreiros
DBLP: Negreiros:Marcelo
Contributed to:
Wrote 6 papers:
- DATE-2006-NegreirosCS #reduction
- An improved RF loopback for test time reduction (MN, LC, AAS), pp. 646–651.
- DATE-2005-NegreirosCS #evaluation #low cost #using
- Noise Figure Evaluation Using Low Cost BIST (MN, LC, AAS), pp. 158–163.
- DATE-v1-2004-NegreirosCS #low cost #testing
- Low Cost Analog Testing of RF Signal Paths (MN, LC, AAS), pp. 292–297.
- DAC-2003-NegreirosCS #low cost
- Ultimate low cost analog BIST (MN, LC, AAS), pp. 570–573.
- DATE-2000-CarroSNJF #component
- Non-Linear Components for Mixed Circuits Analog Front-End (LC, AAdSJ, MN, GPJ, DTF), pp. 544–549.
- DAC-1998-CarroN #adaptation #algorithm #performance
- Efficient Analog Test Methodology Based on Adaptive Algorithms (LC, MN), pp. 32–37.