Travelled to:2 × USA
Collaborated with:J.Y.Lee J.F.Wang
Talks about:circuit (2) fault (2) synchron (1) sequenti (1) approach (1) analysi (1) robust (1) method (1) combin (1) stuck (1)
Person: T. Y. Kuo
DBLP: Kuo:T=_Y=
Contributed to:
19901989Wrote 2 papers:
- DAC-1990-KuoLW #analysis #fault
- A Fault Analysis Method for Synchronous Sequential Circuits (TYK, JYL, JFW), pp. 732–735.
- DAC-1989-WangKL #approach #fault #logic #robust #set
- A New Approach to Derive Robust Sets for Stuck-open Faults in CMOS Combinational Logic Circuits (JFW, TYK, JYL), pp. 726–729.