Travelled to:1 × Germany
2 × France
Collaborated with:L.Balasubramanian O.E.Erol S.Ozev C.K.H.Suresh F.Vartziotis X.Kavousianos K.Chakrabarty A.Jain R.Mittal Y.B.C.Kumar V.R.Devanathan M.Kawoosa
Talks about:multi (3) test (2) use (2) multiplex (1) bandgap (1) voltag (1) toward (1) measur (1) factor (1) space (1)
Person: Rubin A. Parekhji
DBLP: Parekhji:Rubin_A=
Contributed to:
201520142013Wrote 3 papers:
- DATE-2015-ErolOSPB #metric #using
- On-chip measurement of bandgap reference voltage using a small form factor VCO based zoom-in ADC (OEE, SO, CKHS, RAP, LB), pp. 1559–1562.
- DATE-2014-VartziotisKCPJ #multi #optimisation #using
- Multi-site test optimization for multi-Vdd SoCs using space- and time- division multiplexing (FV, XK, KC, RAP, AJ), pp. 1–6.
- DATE-2013-MittalBKDKP #adaptation #manycore #towards
- Towards adaptive test of multi-core RF SoCs (RM, LB, YBCK, VRD, MK, RAP), pp. 743–748.