Travelled to:
5 × USA
Collaborated with:
∅ S.Y.H.Su Y.Won S.Sahni
Talks about:
test (4) network (3) generat (3) combin (3) logic (3) mos (3) design (2) fault (2) autom (2) fan (2)
Person: Yacoub M. El-Ziq
DBLP: El-Ziq:Yacoub_M=
Contributed to:
Wrote 6 papers:
- DAC-1987-WonSE #hardware
- A Hardware Accelerator for Maze Routing (YW, SS, YMEZ), pp. 800–806.
- DAC-1981-El-Ziq #automation #fault #generative #testing
- Automatic test generation for stuck-open faults in CMOS VLSI (YMEZ), pp. 347–354.
- DAC-1980-El-Ziq #generative
- A new test pattern generation system (YMEZ), pp. 62–68.
- DAC-1979-El-Ziq #fault #generative #network #performance #simulation #testing
- Testing of MOS combinational networks a procedure for efficient fault simulation and test generation (YMEZ), pp. 162–170.
- DAC-1978-El-Ziq #automation #constraints #design #logic #network
- Logic design automation of MOS combinational networks with fan-in, fan-out constraints (YMEZ), pp. 240–249.
- DAC-1977-El-ZiqS #automation #design #logic #network
- Logic design automation of diagnosable MOS combinational logic networks (YMEZ, SYHS), pp. 205–215.