@inproceedings{CASE-2017-KongN,
	author        = "Yuting Kong and Dong Ni",
	booktitle     = "{Proceedings of the 13th International Conference on Automation Science and Engineering}",
	doi           = "10.1109/COASE.2017.8256193",
	isbn          = "978-1-5090-6781-7",
	pages         = "744--749",
	publisher     = "{IEEE}",
	title         = "{A practical yield prediction approach using inline defect metrology data for system-on-chip integrated circuits}",
	year          = 2017,
}