@inproceedings{CAV-2017-SinghBM,
	author        = "Eshan Singh and Clark W. Barrett and Subhasish Mitra",
	booktitle     = "{Proceedings of the 28th International Conference on Computer Aided Verification, Part II}",
	doi           = "10.1007/978-3-319-63390-9_6",
	isbn          = "['978-3-319-63389-3', '978-3-319-63390-9']",
	pages         = "104--125",
	publisher     = "{Springer}",
	title         = "{E-QED: Electrical Bug Localization During Post-silicon Validation Enabled by Quick Error Detection and Formal Methods}",
	year          = 2017,
}