Weiwei Mao, Xieting Ling
Robust test generation algorithm for stuck-open fault in CMOS circuits
DAC, 1986.
@inproceedings{DAC-1986-WeiweiX, author = "Weiwei Mao and Xieting Ling", booktitle = "{Proceedings of the 23rd Design Automation Conference}", doi = "10.1145/318013.318051", pages = "236--242", publisher = "{IEEE Computer Society Press}", title = "{Robust test generation algorithm for stuck-open fault in CMOS circuits}", year = 1986, }