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Collaborated with:
W.Mao
Talks about:
algorithm (1) generat (1) circuit (1) robust (1) stuck (1) fault (1) test (1) open (1) cmos (1)

Person: Xieting Ling

DBLP DBLP: Ling:Xieting

Contributed to:

DAC 19861986

Wrote 1 papers:

DAC-1986-WeiweiX #algorithm #fault #generative #robust #testing
Robust test generation algorithm for stuck-open fault in CMOS circuits (WM, XL), pp. 236–242.
Bibliography of Software Language Engineering in Generated Hypertext (BibSLEIGH) is created and maintained by Dr. Vadim Zaytsev.
Hosted as a part of SLEBOK on GitHub.