Tapan J. Chakraborty, Vishwani D. Agrawal, Michael L. Bushnell
Design for Testability for Path Delay faults in Sequential Circuits
DAC, 1993.
@inproceedings{DAC-1993-ChakrabortyAB,
author = "Tapan J. Chakraborty and Vishwani D. Agrawal and Michael L. Bushnell",
booktitle = "{Proceedings of the 30th Design Automation Conference}",
doi = "10.1145/157485.164973",
isbn = "0-89791-577-1",
pages = "453--457",
publisher = "{ACM Press}",
title = "{Design for Testability for Path Delay faults in Sequential Circuits}",
year = 1993,
}