Vivek Chickermane, Elizabeth M. Rudnick, Prithviraj Banerjee, Janak H. Patel
Non-Scan Design-for-Testability Techniques for Sequential Circuits
DAC, 1993.
@inproceedings{DAC-1993-ChickermaneRBP,
author = "Vivek Chickermane and Elizabeth M. Rudnick and Prithviraj Banerjee and Janak H. Patel",
booktitle = "{Proceedings of the 30th Design Automation Conference}",
doi = "10.1145/157485.164686",
isbn = "0-89791-577-1",
pages = "236--241",
publisher = "{ACM Press}",
title = "{Non-Scan Design-for-Testability Techniques for Sequential Circuits}",
year = 1993,
}