Travelled to:
2 × USA
Collaborated with:
P.Banerjee J.H.Patel E.M.Rudnick S.Kim
Talks about:
testabl (2) placement (1) algorithm (1) techniqu (1) sequenti (1) perform (1) circuit (1) driven (1) design (1) scan (1)
Person: Vivek Chickermane
DBLP: Chickermane:Vivek
Contributed to:
Wrote 2 papers:
- DAC-1993-ChickermaneRBP
- Non-Scan Design-for-Testability Techniques for Sequential Circuits (VC, EMR, PB, JHP), pp. 236–241.
- DAC-1992-KimBCP #algorithm #named
- APT: An Area-Performance-Testability Driven Placement Algorithm (SK, PB, VC, JHP), pp. 141–146.