Seiji Kajihara, Irith Pomeranz, Kozo Kinoshita, Sudhakar M. Reddy
Cost-Effective Generation of Minimal Test Sets for Stuck-at Faults in Combinational Logic Circuits
DAC, 1993.
@inproceedings{DAC-1993-KajiharaPKR,
author = "Seiji Kajihara and Irith Pomeranz and Kozo Kinoshita and Sudhakar M. Reddy",
booktitle = "{Proceedings of the 30th Design Automation Conference}",
doi = "10.1145/157485.164617",
isbn = "0-89791-577-1",
pages = "102--106",
publisher = "{ACM Press}",
title = "{Cost-Effective Generation of Minimal Test Sets for Stuck-at Faults in Combinational Logic Circuits}",
year = 1993,
}