Vikas Mehrotra, Shiou Lin Sam, Duane S. Boning, Anantha Chandrakasan, Rakesh Vallishayee, Sani R. Nassif
A methodology for modeling the effects of systematic within-die interconnect and device variation on circuit performance
DAC, 2000.
@inproceedings{DAC-2000-MehrotraSBCVN,
author = "Vikas Mehrotra and Shiou Lin Sam and Duane S. Boning and Anantha Chandrakasan and Rakesh Vallishayee and Sani R. Nassif",
booktitle = "{Proceedings of the 37th Design Automation Conference}",
doi = "10.1145/337292.337370",
pages = "172--175",
publisher = "{ACM}",
title = "{A methodology for modeling the effects of systematic within-die interconnect and device variation on circuit performance}",
year = 2000,
}