Travelled to:1 × USA
Collaborated with:V.Mehrotra D.S.Boning A.Chandrakasan R.Vallishayee S.R.Nassif
Talks about:interconnect (1) methodolog (1) systemat (1) perform (1) circuit (1) within (1) variat (1) effect (1) model (1) devic (1)
Person: Shiou Lin Sam
DBLP: Sam:Shiou_Lin
Contributed to:
2000Wrote 1 papers:
- DAC-2000-MehrotraSBCVN #modelling #performance
- A methodology for modeling the effects of systematic within-die interconnect and device variation on circuit performance (VM, SLS, DSB, AC, RV, SRN), pp. 172–175.