Jing-Jia Liou, Li-C. Wang, Kwang-Ting Cheng, Jennifer Dworak, M. Ray Mercer, Rohit Kapur, Thomas W. Williams
Enhancing test efficiency for delay fault testing using multiple-clocked schemes
DAC, 2002.
@inproceedings{DAC-2002-LiouWCDMKW, author = "Jing-Jia Liou and Li-C. Wang and Kwang-Ting Cheng and Jennifer Dworak and M. Ray Mercer and Rohit Kapur and Thomas W. Williams", booktitle = "{Proceedings of the 39th Design Automation Conference}", doi = "10.1145/513918.514013", isbn = "1-58113-461-4", pages = "371--374", publisher = "{ACM}", title = "{Enhancing test efficiency for delay fault testing using multiple-clocked schemes}", year = 2002, }